Strain induced mobility modulation in single-layer MoS2

被引:57
作者
Hosseini, Manouchehr [1 ]
Elahi, Mohammad [1 ]
Pourfath, Mahdi [1 ,2 ]
Esseni, David [3 ]
机构
[1] Univ Tehran, Sch Elect & Comp Engn, POB 14395-515, Tehran, Iran
[2] TU Wien, Inst Microelect, A-1040 Vienna, Austria
[3] DIEGM, I-33100 Udine, Italy
基金
美国国家科学基金会;
关键词
molybdenum disulphide; mobility; strain engineering; inter-valley scattering; TRANSITION-METAL DICHALCOGENIDES; INTEGRATED-CIRCUITS; MONOLAYER MOS2; TRANSISTORS; BANDGAP;
D O I
10.1088/0022-3727/48/37/375104
中图分类号
O59 [应用物理学];
学科分类号
摘要
In this paper the effect of biaxial and uniaxial strain on the mobility of single-layer MoS2 for temperatures T > 100 K is investigated. Scattering from intrinsic phonon modes, remote phonon and charged impurities are considered along with static screening. Ab initio simulations are utilized to investigate the strain induced effects on the electronic bandstructure and the linearized Boltzmann transport equation is used to evaluate the low-field mobility under various strain conditions. The results indicate that the mobility increases with tensile biaxial and tensile uniaxial strain along the armchair direction. Under compressive strain, however, the mobility exhibits a non-monotonic behavior when the strain magnitude is varied. In particular, with a relatively small compressive strain of 1% the mobility is reduced by about a factor of two compared to the unstrained condition, but with a larger compressive strain the mobility partly recovers such a degradation.
引用
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页数:11
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