共 44 条
- [2] [Anonymous], 2015, C162405 ASTM
- [3] [Anonymous], 2012, NIST XRAY PHOTOELECT
- [8] Examiner-alan P., 1998, United States Patent, Patent No. 3639221
- [9] Franco M., 2012, Int. Sch. Res. Notices, V2012, P1, DOI [10.5402/2012/323676.13, 10.5402/2012/323676, DOI 10.5402/2012/323676]