Electronic comparison of InAs wurtzite and zincblende phases using nanowire transistors

被引:14
作者
Ullah, A. R. [1 ]
Joyce, H. J. [2 ]
Burke, A. M. [1 ]
Wong-Leung, J. [2 ]
Tan, H. H. [2 ]
Jagadish, C. [2 ]
Micolich, A. P. [1 ]
机构
[1] Univ New S Wales, Sch Phys, Sydney, NSW 2052, Australia
[2] Australian Natl Univ, Res Sch Phys & Engn, Dept Elect Mat Engn, Canberra, ACT 0200, Australia
来源
PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS | 2013年 / 7卷 / 10期
基金
澳大利亚研究理事会;
关键词
InAs; nanowire FETs; wurtzite; zincblende; III-V NANOWIRES; TWINNING SUPERLATTICES; HETEROSTRUCTURES; GROWTH;
D O I
10.1002/pssr.201308014
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We compare the electronic characteristics of nanowire field-effect transistors made using single pure wurtzite and pure zincblende InAs nanowires grown from identical catalyst particles. We compare the transfer characteristics and field-effect mobility versus temperature for these devices to better understand how differences in InAs phase govern the electronic properties of nanowire transistors. ((c) 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
引用
收藏
页码:911 / 914
页数:4
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