A new technique for measuring the microwave penetration depth in high-T-c superconducting thin films

被引:1
作者
Aktas, B [1 ]
Durusoy, HZ [1 ]
机构
[1] HACETTEPE UNIV,DEPT PHYS,ANKARA 06532,TURKEY
来源
PHYSICA C | 1996年 / 260卷 / 1-2期
关键词
D O I
10.1016/0921-4534(96)00114-1
中图分类号
O59 [应用物理学];
学科分类号
摘要
The electron spin resonance (ESR) technique has been used to obtain the microwave (MW) penetration depth of YBa2Cu3O7 thin films. An ESR-signal-generating marker was placed in between two high-temperature superconducting (HTSC) films to probe the MW field penetrating through the films. Below the superconducting transition temperature (T-c) the HTSC film started to screen the marker inside the sandwich. A meaningfully diminishing ESR signal was reproducibly recorded for various samples with different markers such as paramagnetic diphenyl pierylhydrazy (DPPH), Mn++ impurity in MgO and a ferromagnetic (FM) permalloy film. The temperature dependence of the ESR signal intensity above and below T-c has been studied to deduce the penetration depth from the measured signal intensity. A very rapid change of A just below T-c, slowed down later at lower temperatures and became smoothly changing. The value lambda(ab) = 1020 Angstrom has been measured for c-axis films at 77 K.
引用
收藏
页码:81 / 85
页数:5
相关论文
共 50 条
  • [31] Measurement system for accurate characterization of microwave surface resistance of high-T-c superconductors thin films
    Luo, ZX
    Yang, K
    Lu, J
    Tang, ZX
    Zhang, QS
    [J]. PHYSICA C, 1997, 282 : 2537 - 2538
  • [32] Penetration depth study of very thin superconducting Nb films
    Lemberger, Thomas R.
    Hetel, Iulian
    Knepper, Jacob W.
    Yang, F. Y.
    [J]. PHYSICAL REVIEW B, 2007, 76 (09):
  • [33] PENETRATION DEPTH AND FLUX CREEP IN THIN SUPERCONDUCTING INDIUM FILMS
    ANDERSON, RA
    GINSBERG, DM
    [J]. PHYSICAL REVIEW B-SOLID STATE, 1972, 5 (11): : 4421 - +
  • [34] THE SUPERLATTICES IN HIGH-T-C SUPERCONDUCTING CUPRATES
    MILAT, O
    KREKELS, T
    VANTENDELOO, G
    AMELINCKX, S
    [J]. PHYSICA C, 1994, 235 : 729 - 730
  • [35] Analysis of the proximity function in electron-beam lithography on high-T-c superconducting thin-films
    Gueorguiev, YM
    Vutova, KG
    Mladenov, GM
    [J]. SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 1996, 9 (07) : 565 - 569
  • [36] LEVITATION FORCES, STIFFNESS AND FORCE-CREEP IN YBCO HIGH-T-C SUPERCONDUCTING THIN-FILMS
    SCHONHUBER, P
    MOON, FC
    [J]. APPLIED SUPERCONDUCTIVITY, 1994, 2 (7-8) : 523 - 534
  • [37] X-ray diffraction measurements and depth profiling by secondary neutral mass spectrometry on epitaxially grown high-T-c superconducting thin films
    Semmelhack, HC
    Borner, H
    Lorenz, M
    [J]. MIKROCHIMICA ACTA, 1997, 125 (1-4) : 211 - 217
  • [38] HIGH-T-c SUPERCONDUCTING SMALL ANTENNAS
    Itoh, K.
    Ishii, O.
    Nagai, Y.
    Suzuki, N.
    Kimachi, Y.
    Michikami, O.
    [J]. IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 1993, 3 (01) : 2836 - 2839
  • [39] Superconducting high-T-c electronic devices
    Barone, A
    Barbanera, S
    Boffa, V
    Filatrella, G
    Gambardella, U
    Matarazzo, S
    Pagano, S
    [J]. CERAMICS INTERNATIONAL, 1996, 22 (05) : 359 - 364
  • [40] INFLUENCE OF ELECTRIC-FIELD ON THE PROPERTIES OF HIGH-T-C SUPERCONDUCTING FILMS
    KONSIN, P
    [J]. PHYSICA C, 1994, 235 : 1437 - 1438