Electrical transport properties of Bi2Sr2Ca2Cu3O10+δ thin film [001] tilt grain boundaries -: art. no. 052507

被引：23

作者：

Hänisch, J ^{[1
]}

Attenberger, A ^{[1
]}

Holzapfel, B ^{[1
]}

Schultz, L ^{[1
]}

机构：

[1] IFW Dresden, D-01171 Dresden, Germany

来源：

PHYSICAL REVIEW B | 2002年 / 65卷 / 05期

关键词：

D O I：

10.1103/PhysRevB.65.052507

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Epitaxial thin films of Bi2Sr2Ca2Cu3O10+delta have been prepared by pulsed laser deposition on SrTiO3 bicrystal substrates with symmetrical [001] tilt grain boundaries of 8degrees, 16degrees 24degrees, 26degrees, 30degrees, and 36.8degrees misorientation angle. The intergrain and intragrain properties of the critical current density and the current-voltage characteristics have been investigated at various temperatures and in magnetic fields up to 7.5 T. The 8degrees grain boundary exhibits flux creep behavior; it does not constitute a weak link. In contrast, grain boundaries with larger angles exhibit weak link behavior. The critical current density falls exponentially with increasing misorientation angle.

引用

页码：1 / 4

页数：4

共 13 条

[11] Fast synthesis and single crystal growth of Pb-free and Pb-doped Bi-2223 superconductors using alkali chlorides flux technique [J].