Dynamic delamination of patterned thin films

被引:17
作者
Kandula, Soma S. V. [1 ]
Tran, Phuong
Geubelle, Philippe H.
Sottos, Nancy R. [1 ]
机构
[1] Univ Illinois, Beckman Inst, Urbana, IL 61801 USA
基金
美国国家科学基金会;
关键词
adhesion; aluminium; cracks; delamination; metallic thin films;
D O I
10.1063/1.3056639
中图分类号
O59 [应用物理学];
学科分类号
摘要
We investigate laser-induced dynamic delamination of a patterned thin film on a substrate. Controlled delamination results from our insertion of a weak adhesion region beneath the film. The inertial forces acting on the weakly bonded portion of the film lead to stable propagation of a crack along the film/substrate interface. Through a simple energy balance, we extract the critical energy for interfacial failure, a quantity that is difficult and sometimes impossible to characterize by more conventional methods for many thin film/substrate combinations.
引用
收藏
页数:3
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