Nanobatteries in redox-based resistive switches require extension of memristor theory

被引:479
作者
Valov, I. [1 ,2 ]
Linn, E. [1 ]
Tappertzhofen, S. [1 ]
Schmelzer, S. [1 ]
van den Hurk, J. [1 ]
Lentz, F. [2 ]
Waser, R. [1 ,2 ]
机构
[1] Rhein Westfal TH Aachen, Inst Werkstoffe Elekt 2, D-52074 Aachen, Germany
[2] Res Ctr Julich GmbH, Peter Grunberg Inst 7, D-52425 Julich, Germany
关键词
SOLID-ELECTROLYTE; DEVICES;
D O I
10.1038/ncomms2784
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Redox-based nanoionic resistive memory cells are one of the most promising emerging nanodevices for future information technology with applications for memory, logic and neuromorphic computing. Recently, the serendipitous discovery of the link between redox-based nanoionic-resistive memory cells and memristors and memristive devices has further intensified the research in this field. Here we show on both a theoretical and an experimental level that nanoionic-type memristive elements are inherently controlled by non-equilibrium states resulting in a nanobattery. As a result, the memristor theory must be extended to fit the observed non-zero-crossing I-V characteristics. The initial electromotive force of the nanobattery depends on the chemistry and the transport properties of the materials system but can also be introduced during redox-based nanoionic-resistive memory cell operations. The emf has a strong impact on the dynamic behaviour of nanoscale memories, and thus, its control is one of the key factors for future device development and accurate modelling.
引用
收藏
页数:9
相关论文
共 39 条
[1]  
[Anonymous], 2001, ELECTROCHEMICAL METH
[2]  
[Anonymous], 2011, INT TECHN ROADM SEM
[3]   The Atomic Switch [J].
Aono, Masakazu ;
Hasegawa, Tsuyoshi .
PROCEEDINGS OF THE IEEE, 2010, 98 (12) :2228-2236
[4]   'Memristive' switches enable 'stateful' logic operations via material implication [J].
Borghetti, Julien ;
Snider, Gregory S. ;
Kuekes, Philip J. ;
Yang, J. Joshua ;
Stewart, Duncan R. ;
Williams, R. Stanley .
NATURE, 2010, 464 (7290) :873-876
[5]   Direct Observation of Charge Transfer in Solid Electrolyte for Electrochemical Metallization Memory [J].
Cho, Deok-Yong ;
Valov, Ilia ;
van den Hurk, Jan ;
Tappertzhofen, Stefan ;
Waser, Rainer .
ADVANCED MATERIALS, 2012, 24 (33) :4552-4556
[6]   Size-Dependent Drift of Resistance Due to Surface Defect Relaxation in Conductive-Bridge Memory [J].
Choi, Seol ;
Balatti, Simone ;
Nardi, Federico ;
Ielmini, Daniele .
IEEE ELECTRON DEVICE LETTERS, 2012, 33 (08) :1189-1191
[7]   HODGKIN-HUXLEY AXON IS MADE OF MEMRISTORS [J].
Chua, Leon ;
Sbitnev, Valery ;
Kim, Hyongsuk .
INTERNATIONAL JOURNAL OF BIFURCATION AND CHAOS, 2012, 22 (03)
[8]   Resistance switching memories are memristors [J].
Chua, Leon .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2011, 102 (04) :765-783
[9]   MEMRISTIVE DEVICES AND SYSTEMS [J].
CHUA, LO ;
KANG, SM .
PROCEEDINGS OF THE IEEE, 1976, 64 (02) :209-223
[10]   MEMRISTOR - MISSING CIRCUIT ELEMENT [J].
CHUA, LO .
IEEE TRANSACTIONS ON CIRCUIT THEORY, 1971, CT18 (05) :507-+