共 18 条
[1]
Anlage S.M., 2007, Scanning Probe Microscopy, Electrical and Electromechanical Phenomena at the Nanoscale, V1, P215, DOI DOI 10.1007/978-0-387-28668-6_8
[8]
Electric near-field enhancement of a sharp semi-infinite conical probe: Material and cone angle dependence
[J].
PHYSICAL REVIEW B,
2006, 74 (23)
[9]
Han W., 2008, 59898881EN AG