Production and characterization of high-pressure microwave glow discharge in a microgap aiming at VUV light source

被引:19
作者
Kono, A [1 ]
Wang, J [1 ]
Aramaki, M [1 ]
机构
[1] Nagoya Univ, Dept Elect Engn & Comp Sci, Chikusa Ku, Nagoya, Aichi 4648603, Japan
关键词
microplasma; atmospheric pressure glow discharge; rare gas excimer; vacuum ultraviolet light source;
D O I
10.1016/j.tsf.2005.08.036
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Using microwave excitation, a high-pressure (similar to 1 atm), high-density (similar to 10(15) cm(-3)), non-equilibrium plasma is produced continuously in the 100-mu m-microgap between two knife-edge electrodes at a power deposition level of similar to 1 MW/cm(3). In discharges using Ar-2 and Xe-2 vacuum ultraviolet emission due to Ar-2 and Xe-2 excimers has been confirmed. To obtain plasma with a gas temperature as low as possible for efficient production of excimer molecules, the gas temperature characteristics of the microgap discharge was studied in detail for air and He/N-2 discharges. The results indicate that the gas temperature is rather insensitive to the gas flow even if the flow is rapid enough to affect the diffusive heat conduction in the plasma. This appears to suggest the existence of a rapid heat transport mechanism other than diffusive heat conduction in the microgap plasma. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:444 / 448
页数:5
相关论文
共 6 条
[1]   High-spatial-resolution multichannel Thomson scattering measurements for atmospheric pressure microdischarge [J].
Kono, A ;
Iwamoto, K .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 2004, 43 (8A) :L1010-L1013
[2]   Production of CW high-density non-equilibrium plasma in the atmosphere using microgap discharge excited by microwave [J].
Kono, A ;
Sugiyama, T ;
Goto, T ;
Furuhashi, H ;
Uchida, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 2001, 40 (3B) :L238-L241
[3]   Measurement of temporal behavior of electron density in a discharge-pumped ArF excimer laser [J].
Nagai, S ;
Furuhashi, H ;
Kono, A ;
Uchida, Y ;
Goto, T .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1998, 34 (06) :942-948
[4]  
Phillips D.M., 1975, J PHYS D, V8, P507
[5]   MODELING OF THE CHARGE-TRANSFER AFTERGLOW EXCITED BY INTENSE ELECTRICAL DISCHARGES IN HIGH-PRESSURE HELIUM NITROGEN MIXTURES [J].
POUVESLE, JM ;
BOUCHOULE, A ;
STEVEFELT, J .
JOURNAL OF CHEMICAL PHYSICS, 1982, 77 (02) :817-825
[6]  
WEAST RC, 1969, CRC HDB CHEM PHYSICS