Modelling of photoluminescence from F2 and F3+ colour centres in lithium fluoride irradiated at high doses by low-energy proton beams

被引:18
作者
Nichelatti, E. [1 ]
Piccinini, M. [2 ]
Ampollini, A. [2 ]
Picardi, L. [2 ]
Ronsivalle, C. [2 ]
Bonfigli, F. [2 ]
Vincenti, M. A. [2 ]
Montereali, R. M. [2 ]
机构
[1] ENEA CR Casaccia, Fus & Technol Safety & Secur Dept, Via Anguillarese 301, I-00123 Rome, Italy
[2] ENEA CR Frascati, Fus & Technol Safety & Secur Dept, Via E Fermi 45, I-00044 Rome, Italy
关键词
Radiation detectors; Protons; Lithium fluoride; Colour centres; Photoluminescence; F-AGGREGATE CENTERS; THIN-FILMS; OPTICAL-PROPERTIES; LIF; DETECTORS; CRYSTALS; DEFECTS;
D O I
10.1016/j.optmat.2019.01.052
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Lithium fluoride (LiF) crystals were irradiated with a proton beam. With nominal beam energies of 3 and 7 MeV, several irradiations were performed which delivered doses ranging from 10(3) to 10(7) Gy. The ionisation produced by the protons in the LiF samples induced the stable formation in the crystalline lattice of colour centres, two types of which, the F-2 and F-3(+) ones, possess broad photoluminescence bands in the red and green, respectively, when optically pumped in the blue at wavelengths close to 450 nm. At both proton energies, measurements of the distinct F-2 and F-3(+) contributions to the emission spectra showed a decrease of the F-3(+) integrated photoluminescence intensity at large doses, say from similar to 10(6)-10(7) Gy on. We try to explain such a behaviour by assuming the formation of absorption and/or quenching centres, and compare the predictions of an ad hoc developed model with experimental data.
引用
收藏
页码:414 / 418
页数:5
相关论文
共 35 条
  • [1] ION-IMPLANTATION IN LIF TO FORM F-CENTER AND F2-CENTER
    ABUHASSAN, LH
    TOWNSEND, PD
    [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1986, 19 (02): : 99 - 110
  • [2] UNIFIED MODEL FOR ALL STAGES OF F-COLORING OF NACL
    AGULLOLOPEZ, F
    JAQUE, F
    [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1973, 34 (11) : 1949 - 1960
  • [3] [Anonymous], PHYS STAT SOL A
  • [4] [Anonymous], APPL PHYS LETT
  • [5] Soft x-ray submicron imaging detector based on point defects in LiF
    Baldacchini, G
    Bollanti, S
    Bonfigli, F
    Flora, F
    Di Lazzaro, P
    Lai, A
    Marolo, T
    Montereali, RM
    Murra, D
    Faenov, A
    Pikuz, T
    Nichelatti, E
    Tomassetti, G
    Reale, A
    Reale, L
    Ritucci, A
    Limongi, T
    Palladino, L
    Francucci, M
    Martellucci, S
    Petrocelli, G
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2005, 76 (11) : 1 - 12
  • [6] Optical bands of F2 and F3+ centers in LiF
    Baldacchini, G
    De Nicola, E
    Montereali, RM
    Scacco, A
    Kalinov, V
    [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 2000, 61 (01) : 21 - 26
  • [7] Concentration of F2 and F3+ defects in He+ implanted LiF crystals determined by optical transmission and photoluminescence measurements
    Bonfigli, F
    Jacquier, B
    Montereali, RM
    Moretti, P
    Mussi, V
    Nichelatti, E
    Somma, F
    [J]. OPTICAL MATERIALS, 2003, 24 (1-2) : 291 - 296
  • [8] Fowler W.B., 1968, PHYS COLOR CTR
  • [9] Studies of swift heavy ion induced colour centres in LIF thin films deposited on silica substrates
    Kumar, M.
    Singh, F.
    Khan, S. A.
    Tripathi, A.
    Avasthi, D. K.
    Pandey, A. C.
    [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2006, 39 (14) : 2935 - 2940
  • [10] Swift heavy ion induced structural and optical modifications in LiF thin film
    Kumar, M
    Singh, F
    Khan, SA
    Baranwal, V
    Kumar, S
    Agarwal, DC
    Siddiqui, AM
    Tripathi, A
    Gupta, A
    Avasthi, DK
    Pandey, AC
    [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2005, 38 (04) : 637 - 641