Investigation of Kelvin probe force microscopy efficiency for the detection of hydrogen ingress by cathodic charging in an aluminium alloy

被引：45

作者：

Larignon, Celine ^{[1
]}

Alexis, Joel ^{[2
]}

Andrieu, Eric ^{[1
]}

Lacroix, Loic ^{[2
]}

Odemer, Gregory ^{[1
]}

Blanc, Christine ^{[1
]}

机构：

[1] Univ Toulouse, CIRIMAT, CNRS, UPS,INPT,ENSIACET, F-31030 Toulouse 4, France

[2] Univ Toulouse, ENIT, LGP, F-65016 Tarbes, France

来源：

SCRIPTA MATERIALIA | 2013年 / 68卷 / 07期

关键词：

Kelvin probe force microscopy (KFM); Secondary ion mass spectroscopy (SIMS); Hydrogen diffusion; Aluminum alloys; CORROSION; PERMEATION;

D O I：

10.1016/j.scriptamat.2012.11.026

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Detecting and locating absorbed hydrogen in aluminium alloys is necessary for evaluating the contribution of hydrogen embrittlement to the degradation of the mechanical properties for corroded or cathodically hydrogen-charged samples. The capability of Kelvin probe force microscopy (KFM) to overcome this issue was demonstrated. Aluminium alloy samples were hydrogenated by cathodic polarization in molten salts (KHSO4/NaHSO4 center dot H2O). The presence of absorbed hydrogen was revealed; the affected zone depth was measured by secondary ion mass spectroscopy analyses and KFM measurements. (C) 2012 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

引用

页码：479 / 482

页数：4

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