ESTIMATION OF YOUNG'S MODULUS AND ADHESIVE FORCE OF POLYMERIC FILMS BY USE OF ATOMIC FORCE MICROSCOPE

被引：0

作者：

Balabanava, N. ^{[1
]}

Rymuza, Z. ^{[1
]}

Chizhik, S. A. ^{[2
]}

机构：

[1] Warsaw Univ Technol, PL-00661 Warsaw, Poland

[2] Natl Acad Sci Belarus, Inst Heat & Mass Transfer, Minsk 220000, BELARUS

来源：

METROLOGY AND MEASUREMENT SYSTEMS | 2006年 / 13卷 / 03期

关键词：

Atomic force microscope; Young's modulus; adhesive (pull-off) force; polymeric films; microhandling; microgripper;

D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Nowadays a big interest exists in microengineering forces to study and test microsystems and their components. There exist a lot of methods and tools to perform this kind of investigations. Most of them need good skills, a lot of time and expensive equipment. We would like to present a simple and quick method to determine such material properties as Young's modulus and adhesive (pull-off) force of thin films applied on e. g. working surfaces of microgrippers.

引用

页码：253 / 260

页数：8