ESTIMATION OF YOUNG'S MODULUS AND ADHESIVE FORCE OF POLYMERIC FILMS BY USE OF ATOMIC FORCE MICROSCOPE

被引：0
作者：
Balabanava, N. [1 ]
Rymuza, Z. [1 ]
Chizhik, S. A. [2 ]
机构：
[1] Warsaw Univ Technol, PL-00661 Warsaw, Poland
[2] Natl Acad Sci Belarus, Inst Heat & Mass Transfer, Minsk 220000, BELARUS
来源：
METROLOGY AND MEASUREMENT SYSTEMS | 2006年 / 13卷 / 03期
关键词：
Atomic force microscope; Young's modulus; adhesive (pull-off) force; polymeric films; microhandling; microgripper;
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Nowadays a big interest exists in microengineering forces to study and test microsystems and their components. There exist a lot of methods and tools to perform this kind of investigations. Most of them need good skills, a lot of time and expensive equipment. We would like to present a simple and quick method to determine such material properties as Young's modulus and adhesive (pull-off) force of thin films applied on e. g. working surfaces of microgrippers.
引用
收藏
页码：253 / 260
页数：8
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