Hidden thin-film phase of dinaphthothienothiophene revealed by high-resolution X-ray diffraction

被引：7

作者：

Shioya, Nobutaka ^{[1
]}

Eda, Kazuo ^{[2
]}

Shimoaka, Takafumi ^{[1
]}

Hasegawa, Takeshi ^{[1
]}

机构：

[1] Kyoto Univ, Inst Chem Res, Uji, Kyoto 6110011, Japan

[2] Kobe Univ, Grad Sch Sci, Dept Chem, Nada Ku, 1-1 Rokko Dai, Kobe, Hyogo 6578501, Japan

来源：

APPLIED PHYSICS EXPRESS | 2020年 / 13卷 / 09期

基金：

日本学术振兴会;

关键词：

DNTT; organic semiconductor; thin-film phase; physical vapor deposition; high-resolution XRD; CRYSTAL-STRUCTURE; EVAPORATED PENTACENE; GROWTH; SUBSTRATE; DNTT; IDENTIFICATION; POLYMORPHISM; SCHERRER;

D O I：

10.35848/1882-0786/abb061

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Dinaphthothienothiophene (DNTT) has attracted considerable attention as a next-generation material for organic thin-film transistors, replacing the conventional basic material of pentacene. Although the performance of DNTT devices is higher than that of pentacene, and has been reported numerously, a comprehensive understanding of thin-film growth is lacking. In fact, thin-film structures have long been believed to be identical to single-crystal structures. In the present study, the thickness-dependent structural evolution is revealed by means of high-resolution X-ray diffraction. This technique apparently discriminates the thin-film structure from the conventionally known bulk structure. Thus, we have revealed the thin-film phase of DNTT for the first time.

引用

页数：5

共 50 条

[21] High-Resolution X-ray Photoelectron Spectroscopy of an IrO2(110) Film on Ir(100)
Martin, R.
Kim, M.
Lee, C. J.
Mehar, V
Albertin, S.
Hejral, U.
Merte, L. R.
Lundgren, E.
Asthagiri, A.
Weaver, J. F.
JOURNAL OF PHYSICAL CHEMISTRY LETTERS, 2020, 11 (17) : 7184 - 7189
[22] Direct x-ray detection using thin-film pentacene Schottky diodes
Vineela, V. Lakshmi
Praveen, P. A.
Kanagasekaran, T.
Kumar, Nitish C.
Murty, N. V. L. Narasimha
JOURNAL OF INSTRUMENTATION, 2022, 17 (02):
[23] Features of the diagnostics of metamorphic InAlAs/InGaAs/InAlAs nanoheterostructures by high-resolution X-ray diffraction in the ω-scanning mode
Vasil'evskii, I. S.
Pushkarev, S. S.
Grekhov, M. M.
Vinichenko, A. N.
Lavrukhin, D. V.
Kolentsova, O. S.
SEMICONDUCTORS, 2016, 50 (04) : 559 - 565
[24] Structure determination of enalapril maleate Form II from high-resolution X-ray powder diffraction data
Kiang, YH
Huq, A
Stephens, PW
Xu, W
JOURNAL OF PHARMACEUTICAL SCIENCES, 2003, 92 (09) : 1844 - 1853
[25] Inflexible stoichiometry in bulk pyrite FeS2 as viewed by in situ and high-resolution X-ray diffraction
McAuliffe, Rebecca D.
Shoemaker, Daniel P.
ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE CRYSTAL ENGINEERING AND MATERIALS, 2018, 74 : 436 - 444
[26] STUDY OF THE SURFACE-LAYER OF LEAD TITANATE THIN-FILM BY X-RAY-DIFFRACTION
LIU, WG
KONG, LB
ZHANG, LY
YAO, X
SOLID STATE COMMUNICATIONS, 1995, 93 (08) : 653 - 657
[27] Structural characterization of three crystalline modifications of telmisartan by single crystal and high-resolution X-ray powder diffraction
Dinnebier, RE
Sieger, P
Nar, H
Shankland, K
David, WIF
JOURNAL OF PHARMACEUTICAL SCIENCES, 2000, 89 (11) : 1465 - 1479
[28] Quantitative Method to Determine Planar Defect Frequency in In As Nanowires by High Resolution X-ray Diffraction
Liu, Ziyang
Merckling, Clement
Caymax, Matty
Rooyackers, Rita
Collaert, Nadine
Thean, Aaron
Richard, Olivier
Bender, Hugo
Vandervorst, Wilfried
Heyns, Marc
CRYSTAL GROWTH & DESIGN, 2015, 15 (08) : 3868 - 3874
[29] Acoustically Mounted Microcrystals Yield High-Resolution X-ray Structures
Soares, Alexei S.
Engel, Matthew A.
Stearns, Richard
Datwani, Sammy
Oechno, Joe
Ellson, Richard
Skinner, John M.
Allaire, Marc
Orville, Allen M.
BIOCHEMISTRY, 2011, 50 (21) : 4399 - 4401
[30] Atomic structure of an FeCrMoCBY metallic glass revealed by high energy x-ray diffraction
Pussi, K.
Louzguine-Luzgin, D., V
Nokelaineni, J.
Barbiellini, B.
Kothalawala, V
Ohara, K.
Yamada, H.
Bansil, A.
Kamali, S.
JOURNAL OF PHYSICS-CONDENSED MATTER, 2022, 34 (28)

← 1 2 3 4 5 →