Thermal reduction of vanadium pentoxide: an XPD study

被引:15
作者
Devriendt, K [1 ]
Poelman, H [1 ]
Fiermans, L [1 ]
机构
[1] State Univ Ghent, Dept Solid State Sci, Surface Phys Div, B-9000 Ghent, Belgium
关键词
electron-solid interactions; scattering; diffraction; photoelectron diffraction; single crystal surfaces; vanadium oxide;
D O I
10.1016/S0039-6028(99)00171-5
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Transition metal oxide surfaces are of interest for a number of catalytic phenomena. In the framework of a V2O5/TiO2 catalyst project, the reduction of V2O5 to lower oxides is investigated by means of X-ray photoelectron diffraction (XPD). Cleaved V2O5(001) surfaces, previously characterized by means of XPD in combination with single scattering simulations, were now reduced by heating (500 degrees C) under an O-2 atmosphere (5 x 10(-4) Torr, 1 h). XPD intensity patterns were recorded with a laboratory XPS apparatus equipped with an Al K alpha source (V 2p(3/2), E-k = 960 eV), as well as at the LURE synchrotron radiation facility (V 3p(3/2), E-k = 68 eV). Single scattering simulations were performed for V2O5(001), oxygen deficient V2O5(001) and V6O13(001) structures. V6O13 is a shear structure of V2O5 and alternates double and single VO-layers. It is seen that the simulations for the single crystal V6O13 reproduce the experimental XPD patterns best. Moreover, the results point towards a termination of the V6O13(001) structure, where the double VO-layer is at the top. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:734 / 739
页数:6
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