Defect-oriented test generation and fault simulation in the environment of MOSCITO

被引:0
作者
Schneider, A
Diener, KH
Gramatova, E
Fisherova, M
Ivask, E
Ubar, R
Pleskacz, W
Kuzmicz, W
机构
来源
BEC 2002: PROCEEDINGS OF THE 8TH BIENNIAL BALTIC ELECTRONIC CONFERENCE | 2002年
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper describes the results of the COPERNICUS europroject JEP-97-7133 VILAB (Virtual LABoratory) on creating an environment for internet-based collaboration in the field of design and test of digital systems. Different CAD tools at geographically different places running under the virtual environment using the MOSCITO system can be used for microelectronics design, fault simulation and test generation purposes. The interfaces between the integrated tools were developed during the project work. The tools can be used separately, or in multiple applications in different complex flows. The functionality of the virtual laboratory in a collaborative experiment on defect-oriented fault simulation and test generation was tested and is described in the paper.
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页码:303 / 306
页数:4
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