共 11 条
[1]
CIBAKOVA T, P DDECS 001, P163
[2]
CIBAKOVA T, 2001, MIXDES 01, P131
[3]
GRAMATOVA E, P DDECS 00, P52
[4]
GRAMATOVA E, P ETW 2000
[5]
HOLLSTEIN T, HIPART NEW HIERARCHI
[6]
JERVAN G, 1999, IEEE EUR TEST WORKSH
[7]
JERVAN G, 1999, 17 NORCHIP C OSL NOV, P291
[8]
Fast test pattern generation for sequential circuits using decision diagram representations
[J].
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS,
2000, 16 (03)
:213-226
[9]
RAIK J, 1998, P IEEE EUR TEST WORK, P145
[10]
Internet-based collaborative test generation with MOSCITO
[J].
DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, 2002 PROCEEDINGS,
2002,
:221-226