Next generation of Ge1-ySny (y=0.01-0.09) alloys grown on Si(100) via Ge3H8 and SnD4: Reaction kinetics and tunable emission

被引:91
|
作者
Grzybowski, G. [1 ]
Beeler, R. T. [1 ]
Jiang, L. [2 ]
Smith, D. J. [2 ]
Kouvetakis, J. [1 ]
Menendez, J. [2 ]
机构
[1] Arizona State Univ, Dept Chem & Biochem, Tempe, AZ 85287 USA
[2] Arizona State Univ, Dept Phys, Tempe, AZ 85287 USA
关键词
MOLECULAR-BEAM EPITAXY; TIN; GE; SEMICONDUCTORS; DEVICES; FILMS; GAP;
D O I
10.1063/1.4745770
中图分类号
O59 [应用物理学];
学科分类号
摘要
Film growth and reaction kinetics studies have shown that trigermane (Ge3H8) is a superior Ge source for the epitaxial synthesis of Ge1-ySny/Si(100) alloys using ultra-high vacuum chemical vapor deposition. The Ge3H8/SnD4 combination yields 3-4 times higher growth rates than the traditional Ge2H6/SnD4 approach, with film Sn/Ge ratios reflecting the corresponding gas-phase stoichiometries much more closely. These advances have led to optical quality Ge1-ySny layers with Sn concentrations up to at least 9% and thicknesses approaching 1 mu m. These thick films are found to be crucial for the observation of a strong, tunable photoluminescence signal near the threshold of the predicted direct-indirect bandgap crossover. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4745770]
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页数:5
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