High-Speed Preparation of Highly (100)-Oriented CeO2 Film by Laser Chemical Vapor Deposition

被引:5
作者
Zhao, Pei [1 ]
Su, Shi [1 ]
Wang, Ying [1 ]
Chi, Chen [1 ]
Zhang, Zhan Hui [1 ]
Mao, Yang Wu [1 ]
Huang, Zhi Liang [1 ]
Xu, Yuan Lai [1 ]
Goto, Takashi [2 ]
机构
[1] Wuhan Inst Technol, Key Lab Green Chem Proc, Hubei Key Lab Plasma Chem & Adv Mat, Minist Educ,Sch Mat Sci & Engn, Wuhan 430074, Peoples R China
[2] Tohoku Univ, Inst Mat Res, Katahira 2-1-1, Sendai, Miyagi 9808577, Japan
基金
中国国家自然科学基金;
关键词
laser chemical vapor deposition; CeO2 buffer layer; high deposition rate; LaAlO3 single crystal; epitaxial growth; SURFACE-MORPHOLOGY; THIN-FILMS; LARGE-AREA; LAYER; SUBSTRATE; DEFECTS; GROWTH;
D O I
10.1111/jace.14279
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
CeO2 films were prepared at deposition temperature ranged from 947 to 1096 K (corresponding laser power was from 52 to 185 W) on (100) LaAlO3 single crystal substrate by laser chemical vapor deposition. At deposition temperature of 1027-1096 K (laser power was from 115 to 185 W), highly (100)-oriented CeO2 films with wedge-caped columnar grains were prepared, whose epitaxial growth relationship was CeO2 [100]//LAO [100] (CeO2 [010]//LAO [011]). Their full width at half maximum of the omega-scan on the (200) reflection and that of the phi-scan on the (220) reflection were 0.8 degrees-1.8 degrees and 0.7 degrees-1.2 degrees, respectively. The highest deposition rate at which CeO2 film with pure (100) preferred orientation could be obtained was 30 mu m h(-1).
引用
收藏
页码:3104 / 3110
页数:7
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