Application of Laser-Backscattering Instruments for In Situ Monitoring of Crystallization Processes - A Review

被引：49
作者：
Heinrich, Joerg [1 ]
Ulrich, Joachim [1 ]
机构：
[1] Univ Halle Wittenberg, Ctr Engn Thermal Proc Technol, D-06120 Halle, Saale, Germany
来源：
CHEMICAL ENGINEERING & TECHNOLOGY | 2012年 / 35卷 / 06期
关键词：
Chord length distribution; Crystallization; Focused beam reflectance measurement; Particle size analysis; Threefold dynamical optical reflectance measurement; BEAM REFLECTANCE MEASUREMENT; PARTICLE-SIZE DISTRIBUTION; BATCH-COOLING CRYSTALLIZATION; CHORD-LENGTH DISTRIBUTIONS; L-GLUTAMIC ACID; ANTISOLVENT CRYSTALLIZATION; ANTI-SOLVENT; PREFERENTIAL CRYSTALLIZATION; INDUSTRIAL CRYSTALLIZATION; POLYMORPHIC TRANSFORMATION;
D O I：
10.1002/ceat.201100344
中图分类号：
TQ [化学工业];
学科分类号：
0817 ;
摘要：
Laser-backscattering instruments, such as the focused beam reflectance measurement or threefold dynamical optical reflectance measurement, are promising tools to aid crystallization process development, allowing an in situ, real-time, and nondestructive measurement of particle size distributions. Besides the instrument principles, in detail geometrical and optical models are discussed which deconvolute the recorded chord length distribution. Emphasis is thereby laid on the influence of the suspension density on instrument recordings. The application of laser-backscattering devices for determination of kinetic constants is discussed and future directions and perspectives are given.
引用
收藏
页码：967 / 979
页数：13
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