Micro Fourier-transform infrared spectroscopy in examination of easel paintings

Paint fragments originating from different easel paintings dated from the 15th and 16th century were examined. They were prepared for analysis in the form of 0.01 mm thick slices microtomed perpendicular to the layers and studied using microspectrometry in infrared (MK-FTIR) and scanning electron microscopy plus energy dispersive X-ray spectrometry (SEM/EDX). The analysis of the chemical composition of each layer visible on cross-sections of the paint chips was carried out, in most cases without any layer separation. The identification of small particles which had to be isolated from some layers was also achieved using both analytical methods. Combining the results obtained from the FTIR and SEM/EDX methods, allowed the identification of most of the painting components, i.e. of the kinds of binders, pigments and fillers present in each layer of the studied samples (except for some kinds of oils and resins).