Apparatus for measuring the Seebeck coefficients of highly resistive organic semiconducting materials

被引：11

作者：

Cai, H. Y. ^{[1
]}

Cui, D. F. ^{[1
]}

Li, Y. T. ^{[1
]}

Chen, X. ^{[1
]}

Zhang, L. L. ^{[1
]}

Sun, J. H. ^{[1
]}

机构：

[1] Chinese Acad Sci, Inst Elect, State Key Lab Transducer Technol, Beijing 100864, Peoples R China

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2013年 / 84卷 / 04期

关键词：

Semiconductor materials;

D O I：

10.1063/1.4799968

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A Seebeck coefficient measurement apparatus for high resistance organic semiconductor materials has been designed and built. It can measure materials with resistance over 7 x 10(12) Omega. This is the highest material resistance value ever reported for Seebeck coefficient measurement. A cyclic temperature gradient generation technique and a corresponding algorithm are proposed to eliminate the negative effects of the long term drift of Seebeck voltage. Sources of errors in these measurements are discussed. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4799968]

引用

页数：4

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