Critical role of gas phase diffusion and high efficiency in vertically aligned carbon nanotube forest growth
被引:7
作者:
Vinten, P.
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Natl Res Council Canada, Ottawa, ON K1A 0R6, Canada
Univ Ottawa, Dept Phys, Ottawa, ON K1N 6N5, CanadaNatl Res Council Canada, Ottawa, ON K1A 0R6, Canada
Vinten, P.
[1
,2
]
Marshall, P.
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Natl Res Council Canada, Ottawa, ON K1A 0R6, CanadaNatl Res Council Canada, Ottawa, ON K1A 0R6, Canada
Marshall, P.
[1
]
Quance, T.
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Natl Res Council Canada, Ottawa, ON K1A 0R6, CanadaNatl Res Council Canada, Ottawa, ON K1A 0R6, Canada
Quance, T.
[1
]
Lefebvre, J.
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Natl Res Council Canada, Ottawa, ON K1A 0R6, CanadaNatl Res Council Canada, Ottawa, ON K1A 0R6, Canada
Lefebvre, J.
[1
]
Finnie, P.
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Natl Res Council Canada, Ottawa, ON K1A 0R6, Canada
Univ Ottawa, Dept Phys, Ottawa, ON K1N 6N5, CanadaNatl Res Council Canada, Ottawa, ON K1A 0R6, Canada
Finnie, P.
[1
,2
]
机构:
[1] Natl Res Council Canada, Ottawa, ON K1A 0R6, Canada
[2] Univ Ottawa, Dept Phys, Ottawa, ON K1N 6N5, Canada
Here the growth kinetics of vertically aligned carbon nanotube forests depend on the size of the patterned catalyst films from which they grow. Forests are grown using chemical vapor deposition on thin film catalyst islands patterned at the 100 mu m scale on silicon wafers. The smaller the pattern, the faster the forest grows and the earlier it stops growing. Furthermore, the shape and structure of the forests, in particular the concavity of their top surface, also depend on the size of the catalyst islands. This result can be understood as a consequence of the high efficiency by which the acetylene source gas is converted into carbon nanotubes (here similar to 30%) and a varying local amount of acetylene source gas available for growth. A diffusion model can explain the observed shape and structure of the forests and their growth kinetics by using experimentally measured parameters. This model also gives insight into the density and growth rate of carbon nanotube forests and suggests a mechanism that coordinates growth rates across the sample and, under certain conditions, can limit the fraction of catalyst nanoparticles that produce nanotubes. Crown Copyright (C) 2013 Published by Elsevier Ltd. All rights reserved.
机构:
USAF, Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
Univ Dayton, Res Inst, Dayton, OH 45469 USAUSAF, Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
Amama, Placidus B.
;
Pint, Cary L.
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机构:
Rice Univ, Dept Phys, Dept Chem, Houston, TX 77251 USA
Rice Univ, Richard E Smalley Inst Nanoscale Sci & Technol, Houston, TX 77251 USAUSAF, Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
Pint, Cary L.
;
Kim, Seung Min
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机构:
Purdue Univ, Sch Mat Engn, W Lafayette, IN 47907 USA
Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USAUSAF, Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
Kim, Seung Min
;
McJilton, Laura
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h-index: 0
机构:
Rice Univ, Dept Phys, Dept Chem, Houston, TX 77251 USA
Rice Univ, Richard E Smalley Inst Nanoscale Sci & Technol, Houston, TX 77251 USAUSAF, Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
McJilton, Laura
;
Eyink, Kurt G.
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USAF, Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USAUSAF, Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
Eyink, Kurt G.
;
Stach, Eric A.
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机构:
Purdue Univ, Sch Mat Engn, W Lafayette, IN 47907 USA
Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USAUSAF, Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
Stach, Eric A.
;
Hauge, Robert H.
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机构:
Rice Univ, Dept Phys, Dept Chem, Houston, TX 77251 USA
Rice Univ, Richard E Smalley Inst Nanoscale Sci & Technol, Houston, TX 77251 USAUSAF, Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
Hauge, Robert H.
;
Maruyama, Benji
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USAF, Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USAUSAF, Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
机构:
USAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
Universal Technol Corp, Dayton, OH 45432 USAUSAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
Amama, Placidus B.
;
Pint, Cary L.
论文数: 0引用数: 0
h-index: 0
机构:
Rice Univ, Dept Phys & Astron, Richard E Smalley Inst Nanoscale Sci & Technol, Houston, TX 77005 USAUSAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
Pint, Cary L.
;
McJilton, Laura
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h-index: 0
机构:
Rice Univ, Dept Chem, Richard E Smalley Inst Nanoscale Sci & Technol, Houston, TX 77005 USAUSAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
McJilton, Laura
;
Kim, Seung Min
论文数: 0引用数: 0
h-index: 0
机构:
Purdue Univ, Sch Mat Engn, W Lafayette, IN 47907 USA
Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USAUSAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
Kim, Seung Min
;
Stach, Eric A.
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机构:
Purdue Univ, Sch Mat Engn, W Lafayette, IN 47907 USA
Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USAUSAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
Stach, Eric A.
;
Murray, P. Terry
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机构:
Univ Dayton, UDRI, Dayton, OH 45469 USAUSAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
Murray, P. Terry
;
Hauge, Robert H.
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机构:
Rice Univ, Dept Chem, Richard E Smalley Inst Nanoscale Sci & Technol, Houston, TX 77005 USAUSAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
Hauge, Robert H.
;
Maruyama, Benji
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h-index: 0
机构:
USAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USAUSAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
机构:
USAF, Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
Univ Dayton, Res Inst, Dayton, OH 45469 USAUSAF, Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
Amama, Placidus B.
;
Pint, Cary L.
论文数: 0引用数: 0
h-index: 0
机构:
Rice Univ, Dept Phys, Dept Chem, Houston, TX 77251 USA
Rice Univ, Richard E Smalley Inst Nanoscale Sci & Technol, Houston, TX 77251 USAUSAF, Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
Pint, Cary L.
;
Kim, Seung Min
论文数: 0引用数: 0
h-index: 0
机构:
Purdue Univ, Sch Mat Engn, W Lafayette, IN 47907 USA
Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USAUSAF, Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
Kim, Seung Min
;
McJilton, Laura
论文数: 0引用数: 0
h-index: 0
机构:
Rice Univ, Dept Phys, Dept Chem, Houston, TX 77251 USA
Rice Univ, Richard E Smalley Inst Nanoscale Sci & Technol, Houston, TX 77251 USAUSAF, Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
McJilton, Laura
;
Eyink, Kurt G.
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h-index: 0
机构:
USAF, Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USAUSAF, Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
Eyink, Kurt G.
;
Stach, Eric A.
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h-index: 0
机构:
Purdue Univ, Sch Mat Engn, W Lafayette, IN 47907 USA
Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USAUSAF, Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
Stach, Eric A.
;
Hauge, Robert H.
论文数: 0引用数: 0
h-index: 0
机构:
Rice Univ, Dept Phys, Dept Chem, Houston, TX 77251 USA
Rice Univ, Richard E Smalley Inst Nanoscale Sci & Technol, Houston, TX 77251 USAUSAF, Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
Hauge, Robert H.
;
Maruyama, Benji
论文数: 0引用数: 0
h-index: 0
机构:
USAF, Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USAUSAF, Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
机构:
USAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
Universal Technol Corp, Dayton, OH 45432 USAUSAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
Amama, Placidus B.
;
Pint, Cary L.
论文数: 0引用数: 0
h-index: 0
机构:
Rice Univ, Dept Phys & Astron, Richard E Smalley Inst Nanoscale Sci & Technol, Houston, TX 77005 USAUSAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
Pint, Cary L.
;
McJilton, Laura
论文数: 0引用数: 0
h-index: 0
机构:
Rice Univ, Dept Chem, Richard E Smalley Inst Nanoscale Sci & Technol, Houston, TX 77005 USAUSAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
McJilton, Laura
;
Kim, Seung Min
论文数: 0引用数: 0
h-index: 0
机构:
Purdue Univ, Sch Mat Engn, W Lafayette, IN 47907 USA
Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USAUSAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
Kim, Seung Min
;
Stach, Eric A.
论文数: 0引用数: 0
h-index: 0
机构:
Purdue Univ, Sch Mat Engn, W Lafayette, IN 47907 USA
Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USAUSAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
Stach, Eric A.
;
Murray, P. Terry
论文数: 0引用数: 0
h-index: 0
机构:
Univ Dayton, UDRI, Dayton, OH 45469 USAUSAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
Murray, P. Terry
;
Hauge, Robert H.
论文数: 0引用数: 0
h-index: 0
机构:
Rice Univ, Dept Chem, Richard E Smalley Inst Nanoscale Sci & Technol, Houston, TX 77005 USAUSAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA
Hauge, Robert H.
;
Maruyama, Benji
论文数: 0引用数: 0
h-index: 0
机构:
USAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USAUSAF, Mat & Mfg Directorate, AFRL RX, Wright Patterson AFB, OH 45433 USA