X-ray diffraction microscopy: emerging imaging techniques for nondestructive analysis of crystalline materials from the millimetre down to the nanometre scale

被引：6

作者：

Borbely, Andras ^{[1
]}

Kaysser-Pyzalla, Anke R. ^{[2
]}

机构：

[1] Ecole Natl Super Mines, F-42023 St Etienne, France

[2] Helmholtz Zentrum Berlin Mat & Energie GmbH, D-14109 Berlin, Germany

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2013年 / 46卷

关键词：

TOMOGRAPHY;

D O I：

10.1107/S0021889813004160

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：295 / 296

页数：2

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