Performance Estimation of Silicon-Based Self-Cooling Device

被引:4
|
作者
Fukuda, Shinji [1 ]
Sabi, Yuichi [2 ]
Kawahara, Toshio [3 ]
Yamaguchi, Satarou [3 ]
机构
[1] Chubu Univ, Dept Elect Engn, Kasugai, Aichi 4878501, Japan
[2] Sony Corp, Adv Mat Labs, Atsugi, Kanagawa 2430021, Japan
[3] Ctr Appl Superconduct & Sustainable Energy Res, Kasugai, Aichi 4878501, Japan
关键词
ELECTRICAL-PROPERTIES; THERMAL-CONDUCTIVITY; SEEBECK COEFFICIENT; TRANSPORT; HOTSPOTS;
D O I
10.7567/JJAP.52.054201
中图分类号
O59 [应用物理学];
学科分类号
摘要
Since self-cooling devices were first proposed, several materials have been tested for their suitability to be used in them. A self-cooling device requires a high Seebeck coefficient, a low electrical resistivity, and a high thermal conductivity. Here, we report experimental results for single-crystal silicon doped with boron. Samples were fabricated with carrier densities in the range of 2.0 +/- 10(15) to 1.6 +/- 10(19) cm(-3), and their Seebeck coefficient and electrical resistivity were measured. Silicon with a carrier density of 1.6 +/- 10(19) cm(-3) has a power factor of 4.8 +/- 10(-3) W/(K-2.m) at room temperature. The cooling capability of a self-cooling device was estimated using a one-dimensional model. The results suggest that a self-cooling device based on silicon with a high carrier density can have a higher heat removal performance than a conventional silicon power device of the same size. (C) 2013 The Japan Society of Applied Physics
引用
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页数:4
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