Second-harmonic spectroscopy of Si nanocrystals embedded in silica

被引：3

作者：

Wirth, A. ^{[1
]}

Wel, J. ^{[1
]}

Gielis, J. J. H. ^{[2
]}

Figliozzi, P. ^{[1
]}

Rafaelsen, J. ^{[3
]}

An, Y. Q. ^{[1
]}

Downer, M. C. ^{[1
]}

机构：

[1] Univ Texas Austin, Dept Phys, Austin, TX 78712 USA

[2] Eindhoven Univ Technol, Dept Appl Phys, NL-5600 MB Eindhoven, Netherlands

[3] Aalborg Univ, Inst Fysik Nanoteknol, DK-9220 Aalborg, Denmark

来源：

PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 5, NO 8 | 2008年

基金：

美国国家科学基金会;

关键词：

D O I：

10.1002/pssc.200779125

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Extending previous second-harmonic generation (SHG) single-wavelength studies [1] of Si nanocrystals (NCs) embedded in fused silics, we implement spectroscopic cross-polarized teo-beam SHG (XP2-SHG) by employing as optical parametric amplifier as a source of widely tunable (1.6 <= E-ph <= 2.4 eV) femtosecond pulses. Subsequent isolation of the SH signal produced by the NCs yields the oscillator strength and phase of their non-linear response. We obtain a broad resonance between bulk Si E-1 and E-2 critical points. Possible explanations for the spectroscopic result are discussed. (c) 2008 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

引用

页码：2662 / +

页数：2

共 14 条

[1] OPTICAL SECOND-HARMONIC GENERATION IN REFLECTION FROM MEDIA WITH INVERSION SYMMETRY [J].