Nanoimaging of Open-Circuit Voltage in Photovoltaic Devices

被引：78

作者：

Tennyson, Elizabeth M. ^{[1
,2
]}

Garrett, Joseph L. ^{[2
,3
]}

Frantz, Jesse A. ^{[4
]}

Myers, Jason D. ^{[4
]}

Bekele, Robel Y. ^{[5
]}

Sanghera, Jasbinder S. ^{[4
]}

Munday, Jeremy N. ^{[2
,6
]}

Leite, Marina S. ^{[1
,2
]}

机构：

[1] Univ Maryland, Dept Mat Sci & Engn, College Pk, MD 20742 USA

[2] Univ Maryland, Inst Res Elect & Appl Phys, College Pk, MD 20742 USA

[3] Univ Maryland, Dept Phys, College Pk, MD 20742 USA

[4] US Naval Res Lab, Washington, DC 20375 USA

[5] Univ Res Fdn, Greenbelt, MD 20770 USA

[6] Univ Maryland, Dept Elect & Comp Engn, College Pk, MD 20742 USA

来源：

ADVANCED ENERGY MATERIALS | 2015年 / 5卷 / 23期

关键词：

PROBE FORCE MICROSCOPY; SCANNING KELVIN PROBE; POLYCRYSTALLINE SOLAR-CELLS; CU(IN; GA)SE-2; THIN-FILMS; NEAR-FIELD; SURFACE PHOTOVOLTAGE; ELECTRICAL CHARACTERIZATION; RESOLUTION; PHOTOGENERATION; RECOMBINATION;

D O I：

10.1002/aenm.201501142

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

A novel imaging platform to determine the open-circuit voltage of solar cells with nanoscale spatial resolution is presented. Here, a variant of illuminated Kelvin probe force microscopy can be implemented to quantify local variations in the voltage of different solar cells. The new metrology can be applied to any optoelectronic device, and works in ambient environments. © 2015 Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim.

引用

页数：8

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