Flow stress/strain rate/grain size coupling for fcc nanopolycrystals

被引：61
作者：
Armstrong, R. W. [1 ]
Rodriguez, P.
机构：
[1] Univ Maryland, College Pk, MD 20742 USA
[2] Indian Inst Technol, Madras 600036, Tamil Nadu, India
来源：
PHILOSOPHICAL MAGAZINE | 2006年 / 86卷 / 36期
关键词：
D O I：
10.1080/14786430600764872
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
A Hall-Petch (H-P)-type dependence is demonstrated for reciprocal activation volume measurements for nanocrystalline and conventional grain size, strengthened Ni and Cu materials, consistent with predictions derived from the dislocation pile-up model. The observed H-P dependence indicates that the shear stress for cross-slip must be involved in the full grain size regime for transmission of plastic flow at the grain boundaries of fee metals.
引用
收藏
页码：5787 / 5796
页数：10
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