Proposal for a New Integrated Circuit and Electronics Neutron Experiment Source at Oak Ridge National Laboratory

被引：1

作者：

Dominik, Laura ^{[1
]}

Normand, Eugene ^{[2
]}

Dion, Michael J. ^{[3
]}

Ferguson, Phillip ^{[4
]}

机构：

[1] Honeywell Inc, Aerosp, Minneapolis, MN 55408 USA

[2] Boeing Res & Technol EN Associates, Appl Phys, Seattle, WA 98124 USA

[3] Rockwell Collins Inc, Commercial Syst Reliabil, Maintainability & Safety Engn, Melbourne, FL 32902 USA

[4] Oak Ridge Natl Lab, Neutron Source Dev Grp, Spallat Neutron Source, Oak Ridge, TN USA

来源：

2009 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, VOLS 1 AND 2 | 2009年

关键词：

NSEU; SEE; SER; Upset; Oak Ridge;

D O I：

10.1109/IRPS.2009.5173385

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

Government and customer specifications increasingly require assessments of the single event effects probability in electronics from atmospheric neutrons. The accelerator that best simulates this neutron spectrum is the WNR facility (Los Alamos), but it is underfunded and oversubscribed for present and future needs. A new beam-line is proposed at the Oak Ridge National Laboratory, as part of the Spallation Neutron Source (SNS).

引用

页码：940 / +

页数：3

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