Optical Performance Monitoring Using Artificial Neural Networks Trained With Eye-Diagram Parameters

被引：28
作者：
Jargon, Jeffrey A. [1 ]
Wu, Xiaoxia [2 ]
Willner, Alan E. [2 ]
机构：
[1] Natl Inst Stand & Technol, Boulder, CO 80305 USA
[2] Univ So Calif, Los Angeles, CA 90089 USA
来源：
IEEE PHOTONICS TECHNOLOGY LETTERS | 2009年 / 21卷 / 1-4期
关键词：
Artificial neural network (ANN); chromatic dispersion (CD); eye diagram; optical performance monitoring (OPM); optical signal-to-noise ratio (OSNR); polarization-mode dispersion (PMD);
D O I：
10.1109/LPT.2008.2008447
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We developed artificial neural network models to simultaneously identify three separate impairments that can degrade optical channels, namely optical signal-to-noise ratio, chromatic dispersion, and polarization-mode dispersion. The neural networks were trained with parameters derived from eye diagrams to create models that can predict levels of concurrent impairments. This method provides a means of monitoring optical performance with diagnostic capabilities.
引用
收藏
页码：54 / 56
页数：3
相关论文
共 11 条
[1]  
[Anonymous], NEURAL NETWORKS RF M
[2]  
*CARL U DEP EL, 2004, NEUROMODELER VER 1 5
[3]  
DODS SD, 2006, OFC NFOEC AN CA MAR
[4]   Application of amplitude histograms to monitor performance of optical channels [J].
Hanik, N ;
Gladisch, A ;
Caspar, C ;
Strebel, B .
ELECTRONICS LETTERS, 1999, 35 (05) :403-404
[5]  
Hassoun M.H., 1995, Fundamentals of artificial neural networks
[6]   MULTILAYER FEEDFORWARD NETWORKS ARE UNIVERSAL APPROXIMATORS [J].
HORNIK, K ;
STINCHCOMBE, M ;
WHITE, H .
NEURAL NETWORKS, 1989, 2 (05) :359-366
[7]   Optical performance monitoring [J].
Kilper, DC ;
Bach, R ;
Blumenthal, DJ ;
Einstein, D ;
Landolsi, T ;
Ostar, L ;
Preiss, A ;
Willner, AE .
JOURNAL OF LIGHTWAVE TECHNOLOGY, 2004, 22 (01) :294-304
[8]   Optical signal quality monitor using direct Q-factor measurement [J].
Ohteru, S ;
Takachio, N .
IEEE PHOTONICS TECHNOLOGY LETTERS, 1999, 11 (10) :1307-1309
[9]   Optical signal quality monitoring method based on optical sampling [J].
Shake, I ;
Takara, W ;
Kawanishi, S ;
Yamabayashi, Y .
ELECTRONICS LETTERS, 1998, 34 (22) :2152-2154
[10]   Automatic identification of impairments using support vector machine pattern classification on eye diagrams [J].
Skoog, Ronald A. ;
Banwell, Thomas C. ;
Gannett, Joel W. ;
Habiby, Sarry F. ;
Pang, Marcus ;
Rauch, Michael E. ;
Toliver, Paul .
IEEE PHOTONICS TECHNOLOGY LETTERS, 2006, 18 (21-24) :2398-2400
12