A nanoscopic view of structure and deformation of hard elastic polypropylene with scanning force microscopy

被引:1
作者
Hild, S
Gutmannsbauer, W
Luth, R
Fuhrmann, J
Guntherodt, HJ
机构
[1] UNIV BASEL,INST PHYS,CH-4056 BASEL,SWITZERLAND
[2] TECH UNIV CLAUSTHAL,INST CHEM PHYS,D-38678 CLAUSTHAL ZELLERF,GERMANY
关键词
atomic force microscopy; hard elastic polypropylene; microstructure; surface morphology;
D O I
10.1002/(SICI)1099-0488(19960915)34:12<1953::AID-POLB1>3.3.CO;2-E
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
Scanning force microscopy (SFM) was used to visualize the surface of hard elastic polypropylene (HEPP) film. The surface morphology of unstrained HEPP shows crystalline and noncrystalline rows oriented parallel to the extrusion direction. The crystalline rows are composed of lamellar blocks. The dimensions of crystalline and noncrystalline regions are determined. The structural surface changes induced by stepwise elongation of the film with a home-built stretching device are documented by SFM. Stretching of HEPP perpendicular to the extrusion direction causes cracks advancing through several crystalline rows. During elongation parallel to the extrusion direction the separation of adjacent lamellae by their translatory displacement occurs. Deformation-induced structural changes of HEPP on the nanometer scale are compared with proposed deformation models. Nanostructural changes are correlated with characteristic variations in the force-elongation curve. (C) 1996 John Wiley & Sons, Inc.
引用
收藏
页码:1953 / 1959
页数:7
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