Study on the electrical transport properties of La2/3Ba1/3MnO3:Ag0.04/LaAlO3 (001) films

被引:1
作者
Liu, Xiang [1 ]
Zhao, Shuang [1 ]
Zhang, Shao-Chun [1 ]
机构
[1] Kunming Univ Sci & Technol, Sch Mat Sci & Engn, Kunming 650093, Yunnan, Peoples R China
关键词
La2/3Ba1/3MnO3:Ag-x; Electrical transport properties; Pulsed laser deposition technique; Metal-insulator transition temperature; TCR TEMPERATURE-COEFFICIENT; THIN-FILMS; AG; MAGNETORESISTANCE; RESISTIVITY; COMPOSITES;
D O I
10.1016/j.physb.2016.10.016
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
La2/3Ba1/3MnO3: wt%Ag-x (LBMO:Ag-x, x=0.04) films were prepared on single crystalline (001)-orientated LaAlO3 substrates by pulsed laser deposition technique. All the samples show along the (00l) orientation in rhombohedral structure with R3c space group. The surface roughness (Ra), insulator-metal transition temperature (Tp) and resistivity at Tp (rho(Tp)) of the LBMO: Ag0.04 films reached optimal values of 3.29 nm, 288 K and 0.033 Omega cm at 740 degrees C, respectively. The improvement of electrical transport properties in the films are attributed to the optimal growth temperature and Ag-doping improve the microstructure of the surfaces, grain boundaries (GBs) in connectivity and better crystallization. In addition, the electrical conduction behaviors can be well fitted with the grain/domain boundary, electron-electron and magnon scattering mechanisms in the ferromagnetic metallic region (T < Tp), as well as with the adiabatic small polaron hopping mechanism in the paramagnetic insulating region (T > Tp).
引用
收藏
页码:92 / 95
页数:4
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