A new approach for electron tomography: Annular dark-field transmission electron microscopy

被引：57
作者：
Bals, S
Van Tendeloo, G
Kisielowski, C
机构：
[1] Univ Antwerp, EMAT, B-2020 Antwerp, Belgium
[2] Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA
来源：
ADVANCED MATERIALS | 2006年 / 18卷 / 07期
关键词：
D O I：
10.1002/adma.200502201
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
Annular dark-field transmission electron microscopy uses an annular objective aperture that blocks the central beam and all electrons scattered up to a certain serniangle. A contrast suitable for electron tomography is generated and 3D reconstructions of CdTe tetrapods and C nanotubes (see figure) are successfully obtained. With short exposure times and high contrast, the technique could be useful not only for materials science, but also for biological applications.
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页码：892 / +
页数：5
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