A new approach for electron tomography: Annular dark-field transmission electron microscopy

被引：57
作者：
Bals, S
Van Tendeloo, G
Kisielowski, C
机构：
[1] Univ Antwerp, EMAT, B-2020 Antwerp, Belgium
[2] Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA
来源：
ADVANCED MATERIALS | 2006年 / 18卷 / 07期
关键词：
D O I：
10.1002/adma.200502201
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
Annular dark-field transmission electron microscopy uses an annular objective aperture that blocks the central beam and all electrons scattered up to a certain serniangle. A contrast suitable for electron tomography is generated and 3D reconstructions of CdTe tetrapods and C nanotubes (see figure) are successfully obtained. With short exposure times and high contrast, the technique could be useful not only for materials science, but also for biological applications.
引用
收藏
页码：892 / +
页数：5
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