Spectroscopy study of Bi12GeO20 single crystals

被引：0

作者：

Lazarevic, Z. Z. ^{[1
]}

Kostic, S. ^{[1
]}

Radojevic, V. ^{[2
]}

Romcevic, M. J. ^{[1
]}

Hadzic, B. ^{[1
]}

Trajic, J. ^{[1
]}

Romcevic, N. Z. ^{[1
]}

机构：

[1] Univ Belgrade, Inst Phys, Belgrade, Serbia

[2] Univ Belgrade, Fac Technol & Met, Belgrade 11000, Serbia

来源：

OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS | 2013年 / 7卷 / 1-2期

关键词：

Bi12GeO20; Czochralski method; XRD; Raman spectroscopy; FTIR; GRADIENT CZOCHRALSKI TECHNIQUE; BI12SIO20; CRYSTALS; SILLENITES; GROWTH; MODES;

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In this work single crystals of bismuth germanium oxide (Bi12GeO20) have been grown by the Czochralski method. Growth conditions were studied. The critical diameter and the critical rate of rotation were calculated. Suitable polishing and etching solutions were determined. The structure of the Bi12GeO20 has been investigated by X-ray diffraction, Raman and FTIR spectroscopy. The obtained results are discussed and compared with published data. On the basis of the measurements by Raman spectroscopy, we observed 15 modes.

引用

页码：58 / 61

页数：4

共 11 条

[1] FTIR SPECTROSCOPY OF OH STRETCHING MODES IN BSO, BGO AND BTO SILLENITES [J].