共 21 条
- [1] [Anonymous], P DES AUT TEST EUR C
- [2] [Anonymous], P 2 INT C DISTR COMP
- [3] [Anonymous], P IEEE COMP SOC ANN
- [4] BENINI L, DATE 2002 0303
- [5] Defect and error tolerance in the presence of massive numbers of defects [J]. IEEE DESIGN & TEST OF COMPUTERS, 2004, 21 (03): : 216 - 227
- [6] COTA E, 2003, INT TEST C ITC 2003
- [7] Dally WJ, 2001, DES AUT CON, P684, DOI 10.1109/DAC.2001.935594
- [8] FLOYD S, 1999, IEEE ACM T NETWORK
- [9] HAMANI A, 2000, P IEEE NORCHIP C NOV
- [10] HENDRICK C, 1988, 1058 RFC IETF NETW W