X-ray diffraction line profile analysis of Cu-2 wt. % Cr-6 wt. % Mo alloy mechanically alloyed

By X-ray diffraction line profile analysis it is possible to obtain valid information of structure and properties of materials. This method is a powerful toot for nanomaterials microstructure characterization. In the present work mechanical alloying of ternary system Cu -2 wt. % Cr -6wt. % Mo was made between 0.25 and 4 h of milling. By means of modified Warren-Averbach and Williamson-Hall methods the crystallite size, dislocation density, microstrain and average distance between dislocations were estimated. The crystallite size values were corrected by stacking fault presence. It was demonstrated that powders have a high anisotropic strain, which was corrected using the average dislocation contrast factors for fcc structures. Also the influence of milling time and percentage of solute on stacking fault probability and stacking fault energy was determined.