A novel technique for the measurement of the acoustic properties of a thin linear-viscoelastic layer using a planar ultrasonic transducer

被引:11
作者
Bai, Xiaolong [1 ]
Sun, Zeqing [1 ]
Chen, Jian [1 ]
Ju, Bing-Feng [1 ]
机构
[1] Zhejiang Univ, State Key Lab Fluid Power Transmiss & Control, Hangzhou 310027, Zhejiang, Peoples R China
基金
中国国家自然科学基金; 国家高技术研究发展计划(863计划);
关键词
ultrasonic measurement; non-destructive evaluation; simultaneous; time-of-flight; thickness; sound velocity; acoustic impedance; attenuation coefficient; THICKNESS; ATTENUATION; DENSITY;
D O I
10.1088/0957-0233/24/12/125602
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Thin linear-viscoelastic layers such as films and coatings have many applications. Simultaneous measurement of the multiple acoustic properties of a thin layer is of great importance in ensuring its quality. In this paper, a novel technique is proposed for the simultaneous determination of the three acoustic properties of a thin linear-viscoelastic layer, namely the acoustic impedance Z(2), the time-of-flight Delta t(2) and the attenuation coefficient alpha(2). A planar ultrasonic transducer, at normal incidence, is used to interrogate the thin layer, and all the reflections are received by the same transducer. Firstly, an optimal estimate of Z2 is obtained by subtracting the echo from the front surface of the thin layer from all the received echoes. After this determination of the acoustic impedance, optimal estimates for Delta t(2) and alpha(2) can be found if the echo from the back surface of the thin layer is subtracted without any remainder. This technique avoids the convergence problem that is frequently encountered in the traditional measurement techniques based mainly on fitting the experimental reflection spectrum to a theoretical model. The effectiveness of the new technique is firstly confirmed by numerical simulation and then by experimental application to four thin linear-viscoelastic layers. Experimental results show that Z2 and Delta t(2) can be obtained accurately while the error in determining of alpha(2) is relatively
引用
收藏
页数:9
相关论文
共 14 条
[1]   Scanning acoustic microscopy an application for evaulating varnish layer conditions non-destructively [J].
Brand, Sebastian ;
Raum, Kay ;
Czurratis, Peter .
2008 IEEE ULTRASONICS SYMPOSIUM, VOLS 1-4 AND APPENDIX, 2008, :615-+
[2]  
Briggs A.O. Kolosov., 2010, ACOUSTIC MICROSCOPY
[3]   An ultrasonic methodology for determining the mechanical and geometrical properties of a thin layer using a deconvolution technique [J].
Chen, Jian ;
Bai, Xiaolong ;
Yang, Keji ;
Ju, Bing-Feng .
ULTRASONICS, 2013, 53 (07) :1377-1383
[4]   Angular measurement of acoustic reflection coefficients by the inversion of V(z, t) data with high frequency time-resolved acoustic microscopy [J].
Chen, Jian ;
Bai, Xiaolong ;
Yang, Keji ;
Ju, Bing-Feng .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2012, 83 (01)
[5]   Non-invasive and non-destructive ultrasonic technique for the detection of microbial contamination in packed UHT milk [J].
Elvira, L ;
Sampedro, L ;
Matesanz, J ;
Gómez-Ullate, Y ;
Resa, P ;
Iglesias, JR ;
Echevarría, FJ ;
de Espinosa, FM .
FOOD RESEARCH INTERNATIONAL, 2005, 38 (06) :631-638
[6]  
GRACIET C, 1994, ULTRASON, P1219, DOI 10.1109/ULTSYM.1994.401805
[7]   Time-frequency analysis for ultrasonic measurement of liquid-layer thickness [J].
Jiao, Jingpin ;
Liu, Wenhua ;
Zhang, Jie ;
Zhang, Qiang ;
He, Cunfu ;
Wu, Bin .
MECHANICAL SYSTEMS AND SIGNAL PROCESSING, 2013, 35 (1-2) :69-83
[8]   Simultaneous measurement of local longitudinal and transverse wave velocities, attenuation, density, and thickness of films by using point-focus ultrasonic spectroscopy [J].
Ju, Bing-Feng ;
Bai, Xiaolong ;
Chen, Jian .
JOURNAL OF APPLIED PHYSICS, 2012, 112 (08)
[9]   Determination of elastic moduli, density, attenuation, and thickness of a layer using ultrasonic spectroscopy at two angles [J].
Lavrentyev, AI ;
Rokhlin, SI .
JOURNAL OF THE ACOUSTICAL SOCIETY OF AMERICA, 1997, 102 (06) :3467-3477
[10]   Aligned carbon nanotube based ultrasonic microtransducers for durability monitoring in civil engineering [J].
Lebental, B. ;
Chainais, P. ;
Chenevier, P. ;
Chevalier, N. ;
Delevoye, E. ;
Fabbri, J-M ;
Nicoletti, S. ;
Renaux, P. ;
Ghis, A. .
NANOTECHNOLOGY, 2011, 22 (39)