A Test Platform for Dependability Analysis of SoCs Exposed to EMI and Radiation

被引：8

作者：

Benfica, Juliano ^{[1
]}

Bolzani Poehls, Leticia Maria ^{[1
]}

Vargas, Fabian ^{[1
]}

Lipovetzky, Jose ^{[2
]}

Lutenberg, Ariel ^{[2
]}

Gatti, Edmundo ^{[3
]}

Hernandez, Fernando ^{[4
]}

机构：

[1] Catholic Univ PUCRS, Porto Alegre, RS, Brazil

[2] Univ Buenos Aires, Fac Ingn, Buenos Aires, DF, Argentina

[3] INTI, Buenos Aires, DF, Argentina

[4] Univ ORT, Montevideo, Uruguay

来源：

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 2012年 / 28卷 / 06期

关键词：

System-on-Chip; Electromagnetic Interference; Total-Ionizing Dose Radiation; Testing Platform;

D O I：

10.1007/s10836-012-5334-z

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

With the IEC 62.132 proposal, the roadmap for standardization of Electromagnetic (EM) immunity measurement methods has reached a high degree of success. The same understanding can be taken from the MIL-STD-883 H for Total Ionizing Dose (TID) radiation. However, no effort has been made to measure the behavior of electronics operating under the combined effects of both, EM noise and TID radiation. For the reasons pointed out, the combined-effect measurements should be mandatory when dealing with Systems-on-Chip (SoCs) devoted to critical applications. In this paper, we present a configurable platform devoted to perform combined tests of EM immunity and TID radiation of SoCs according to the international standards.

引用

页码：803 / 816

页数：14

共 16 条

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[2]

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[3]

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[4]

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