Polarization-Controlled Raman Microscopy and Nanoscopy

被引:39
作者
Saito, Yuika [1 ]
Verma, Prabhat [1 ]
机构
[1] Osaka Univ, Dept Appl Phys, Suita, Osaka 5650871, Japan
关键词
RADIAL-POLARIZATION; FIELD; EXCITATION; SPECTROSCOPY; RESOLUTION; SPECTRA; LIGHT;
D O I
10.1021/jz300213t
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Polarization imaging reveals unique characteristics of samples, such as molecular symmetry, orientation, or intermolecular interactions. Polarization techniques extend the ability of conventional spectroscopy to enable the characterization and identification of molecular species. In the early days of spectroscopy, it was considered that a set of polarizers placed in the illumination and the detection paths was enough to enable polarization analysis. However, with the development of new microscope imaging techniques, such as high-resolution microscopy, nonlinear spectroscopic imaging, and near-field microscopy, the inevitable polarization changes caused by external optical components needs to be discussed. In this Perspective, we present some of the hot topics that are specific to high-spatial-resolution microscopy and introduce recent related work in the field. Among the many spectroscopic techniques available, we focus in particular on Raman spectroscopy because Raman tensors are widely used in pure and applied sciences to study the symmetry of matter.
引用
收藏
页码:1295 / 1300
页数:6
相关论文
共 41 条
[11]   Alignment-Induced Epitaxial Transition in Organic-Organic Heteroepitaxy [J].
Guo, Dong ;
Sakamoto, Kenji ;
Miki, Kazushi ;
Ikeda, Susumu ;
Saiki, Koichiro .
PHYSICAL REVIEW LETTERS, 2008, 101 (23)
[12]   ANOMALOUS POLARIZATION IN RESONANCE RAMAN EFFECT OF OCTAHEDRAL HEXACHLOROIRIDATE (IV) ION [J].
HAMAGUCHI, H ;
HARADA, I ;
SHIMANOUCHI, T .
CHEMICAL PHYSICS LETTERS, 1975, 32 (01) :103-107
[13]   Metallized tip amplification of near-field Raman scattering [J].
Hayazawa, N ;
Inouye, Y ;
Sekkat, Z ;
Kawata, S .
OPTICS COMMUNICATIONS, 2000, 183 (1-4) :333-336
[14]   Detection and characterization of longitudinal field for tip-enhanced Raman spectroscopy [J].
Hayazawa, N ;
Saito, Y ;
Kawata, S .
APPLIED PHYSICS LETTERS, 2004, 85 (25) :6239-6241
[15]   Imaging and strain analysis of nano-scale SiGe structures by tip-enhanced Raman spectroscopy [J].
Hermann, Peter ;
Hecker, Michael ;
Chumakov, Dmytro ;
Weisheit, Martin ;
Rinderknecht, Jochen ;
Shelaev, Artem ;
Dorozhkin, Pavel ;
Eng, Lukas M. .
ULTRAMICROSCOPY, 2011, 111 (11) :1630-1635
[16]   Polarization structuring for focal volume shaping in high-resolution microscopy [J].
Iglesias, Ignacio ;
Vohnsen, Brian .
OPTICS COMMUNICATIONS, 2007, 271 (01) :40-47
[17]   Resonance Raman spectra of carbon nanotubes by cross-polarized light -: art. no. 107403 [J].
Jorio, A ;
Pimenta, MA ;
Souza, AG ;
Samsonidze, GG ;
Swan, AK ;
Ünlü, MS ;
Goldberg, BB ;
Saito, R ;
Dresselhaus, G ;
Dresselhaus, MS .
PHYSICAL REVIEW LETTERS, 2003, 90 (10) :4
[18]   Single molecule detection using surface-enhanced Raman scattering (SERS) [J].
Kneipp, K ;
Wang, Y ;
Kneipp, H ;
Perelman, LT ;
Itzkan, I ;
Dasari, R ;
Feld, MS .
PHYSICAL REVIEW LETTERS, 1997, 78 (09) :1667-1670
[19]   Circularly Polarized Light Emission from Semiconductor Planar Chiral Nanostructures [J].
Konishi, Kuniaki ;
Nomura, Masahiro ;
Kumagai, Naoto ;
Iwamoto, Satoshi ;
Arakawa, Yasuhiko ;
Kuwata-Gonokami, Makoto .
PHYSICAL REVIEW LETTERS, 2011, 106 (05)
[20]   Local stress determination in shallow trench insulator structures with one-side and two-sides pad-SiN layer by polarized micro-Raman spectroscopy extraction and mechanical modelization [J].
Liao, Milton M. H. .
JOURNAL OF APPLIED PHYSICS, 2009, 105 (09)