Flexible Memristive Devices Based on InP/ZnSe/ZnS Core-Multishell Quantum Dot Nanocomposites

被引:33
作者
Kim, Do Hyeong [1 ]
Wu, Chaoxing [1 ]
Park, Dong Hyun [1 ]
Kim, Woo Kyum [1 ]
Seo, Hae Woon [2 ]
Kim, Sang Wook [2 ]
Kim, Tae Whan [1 ]
机构
[1] Hanyang Univ, Dept Elect & Comp Engn, Seoul 04763, South Korea
[2] Ajou Univ, Dept Mol Sci & Technol, Suwon 443749, South Korea
基金
新加坡国家研究基金会;
关键词
memristive device; memory device; flexible devices; InP/ZnSe/ZnS core-multishell quantum dots; nanocomposites; MEMORY DEVICES; NONVOLATILE MEMORY; RESISTIVE MEMORY; LAYER; MECHANISMS;
D O I
10.1021/acsami.7b18817
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The effects of the ZnS shell layer on the memory performances of flexible memristive devices based on quantum dots (QDs) with an InP/ZnSe/ZnS core-multishell structure embedded in a poly(methylmethacrylate) layer were investigated. The on/off ratios of the devices based on QDs with an InP/ZnSe core-shell structure and with an InP/ZnSe/ZnS core-multishell structure were approximately 4.2 X 10(2) and 8.5 X 10(3), respectively, indicative of enhanced charge storage capability in the latter. After bending, the memory characteristics of the memristive devices based on QDs with the InP/ZnSe/ZnS structure were similar to those before bending. In addition, those devices maintained the same on/off ratios for retention time of 1 X 10(4) s, and the number of endurance cycles was above 1 X 10(2). The reset voltages ranged from -2.3 to -3.1 V, and the set voltages ranged from 1.3 to 2.1 V, indicative of reliable electrical characteristics. Furthermore, the possible operating mechanisms of the devices are presented on the basis of the electron trapping and release mode.
引用
收藏
页码:14843 / 14849
页数:7
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