Optical and structural properties of ZnO/TiO2/ZnO multi-layers prepared via electron beam evaporation

被引:43
作者
Choi, Won Seok [1 ]
Kim, Eui Jung [2 ]
Seong, Seung Gie [1 ]
Kim, Yong Soo [1 ]
Park, Chinho [3 ]
Hahn, Sung Hong [1 ]
机构
[1] Univ Ulsan, Dept Phys, Ulsan 680749, South Korea
[2] Univ Ulsan, Dept Chem Engn, Ulsan 680749, South Korea
[3] Yeungnam Univ, Sch Display & Chem Engn, Kyongsan 712749, South Korea
关键词
Electron beam evaporation; ZnO; Thin films; TiO2 buffer layer; Photoluminescence; ZNO THIN-FILMS; PULSED-LASER DEPOSITION; ZINC-OXIDE; GAS SENSOR; BAND-EDGE; PHOTOLUMINESCENCE; SAPPHIRE; NANORODS; LAYER; AL;
D O I
10.1016/j.vacuum.2008.09.006
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We prepared a ZnO/TiO2/ZnO multi-layer on quartz glass substrate via electron beam evaporation. Optical and structural properties of the ZnO/TiO2/ZnO multi-layer were investigated. The TiO2 buffer layer is found to improve the crystallinity of the ZnO thin film. A green emission of the ZnO thin film deposited on the TiO2 buffer layer was significantly enhanced due to the increased defect concentration of oxygen vacancy. Photoluminesence spectra measured at 9 K revealed that a violet luminescence at 409 nm was attributed to the draft of the donor's defect levels in the ZnO thin film. (C) 2008 Elsevier Ltd. All rights reserved.
引用
收藏
页码:878 / 882
页数:5
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