Second-harmonic spectroscopy of nano-interfaces

被引：2
作者：
Sun, L [1 ]
Figliozzi, P [1 ]
Jiang, Y [1 ]
Downer, MC [1 ]
Mochán, WL [1 ]
Mendoza, BS [1 ]
机构：
[1] Univ Texas, Dept Phys, Austin, TX 78712 USA
来源：
PHYSICA STATUS SOLIDI C - CONFERENCES AND CRITICAL REVIEWS, VOL 2 , NO 12 | 2005年 / 2卷 / 12期
关键词：
SILICON NANOCRYSTALS; GENERATION;
D O I：
10.1002/pssc.200562228
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Optical second-harmonic is shown to be a noninvasive, interface-sensitive probe of silicon nanocrystals. The TEM01 spatial mode of SHG radiation from a silicon nanocrystal composite indicates there is nonlocal dipolar (quadrupolar) polarization source which is proportional to the gradient of the incoming electric field. With two orthogonally polarized laser beams, we enhanced the SHG from nanocrystals by creating wavelength-scale, forward-radiating gradient in the second-harmonic polarization. The quantitative features of two-beam SHG were also studied with a fused silica slide. We demonstrate several techniques for isolating the nano-interface signal from the (bulk-quadrupolar) substrate signal in our samples. (c) 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
引用
收藏
页码：4067 / 4071
页数：5
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