Effects of Amplitude Variations on Deformation and Damage Evolution in SnAgCu Solder in Isothermal Cycling

被引:16
作者
Wentlent, Luke [1 ]
Alghoul, Thaer M. [2 ]
Greene, Christopher M. [2 ]
Borgesen, Peter [2 ]
机构
[1] Univ Instruments Corp, Binghamton, NY 13904 USA
[2] SUNY Binghamton, Dept Syst Sci & Ind Engn, POB 6000, Binghamton, NY 13902 USA
基金
美国国家科学基金会;
关键词
Lead-free; microstructure; recrystallization; fatigue cycling; creep; JOINT FATIGUE LIFE; THERMOMECHANICAL RESPONSE; CREEP-BEHAVIOR; SN; AG; RECRYSTALLIZATION; RELIABILITY; ORIENTATION; ANISOTROPY; FAILURE;
D O I
10.1007/s11664-018-6129-5
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Although apparently simpler than in thermal cycling, the behavior of SnAgCu (SAC) solder joints in cyclic bending or vibration is not currently well understood. The rate of damage has been shown to scale with the inelastic work per cycle, and excursions to higher amplitudes lead to an apparent softening, some of which remains so that damage accumulation is faster in subsequent cycling at lower amplitudes. This frequently leads to a dramatic breakdown of current damage accumulation rules. An empirical damage accumulation rule has been proposed to account for this, but any applicability to the extrapolation of accelerated test results to life under realistic long-term service conditions remains to be validated. This will require a better understanding of the underlying mechanisms. The present work provides experimental evidence to support recent suggestions that the observed behavior is a result of cycling-induced dislocation structures providing for increased diffusion creep. It is argued that this means that the measured work is an indicator of the instantaneous dislocation density, rather than necessarily reflecting the actual work involved in the creation of the damage.
引用
收藏
页码:2752 / 2760
页数:9
相关论文
共 50 条
[1]  
Alghoul T., 2016, 66 IEEE EL COMP TECH
[2]   The effect of Sn grain number and orientation on the shear fatigue life of SnAgCu solder joints [J].
Arfaei, B. ;
Xing, Y. ;
Woods, J. ;
Wolcott, J. ;
Tumne, P. ;
Borgesen, P. ;
Cotts, E. .
58TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, PROCEEDINGS, 2008, :459-+
[3]  
Batieha F., 2015, 65 IEEE EL COMP TECH, P1553
[4]  
Bieler T., 2007, PB FREE ROHS COMP MA
[5]   Influence of Sn grain size and orientation on the thermomechanical response and reliability of Pb-free solder joints [J].
Bieler, Thomas R. ;
Jiang, Hairong ;
Lehman, Lawrence P. ;
Kirkpatrick, Tim ;
Cotts, Eric J. ;
Nandagopal, Bala .
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 2008, 31 (02) :370-381
[6]   Solder joint reliability under realistic service conditions [J].
Borgesen, P. ;
Hamasha, S. ;
Obaidat, M. ;
Raghavan, V. ;
Dai, X. ;
Meilunas, M. ;
Anselm, M. .
MICROELECTRONICS RELIABILITY, 2013, 53 (9-11) :1587-1591
[7]  
Borgesen P., 2011, P SMTA PAN PAC MICR
[8]   Pb-free solder:: New materials considerations for microelectronics processing [J].
Borgesen, Peter ;
Bieler, Thomas ;
Lehman, L. P. ;
Cotts, E. J. .
MRS BULLETIN, 2007, 32 (04) :360-365
[9]   Effect of grain orientation on mechanical properties and thermomechanical response of Sn-based solder interconnects [J].
Chen, Hongtao ;
Yan, Bingbing ;
Yang, Ming ;
Ma, Xin ;
Li, Mingyu .
MATERIALS CHARACTERIZATION, 2013, 85 :64-72
[10]   Effect of Ag and Cu concentrations on the creep behavior of Sn-based solders [J].
Chen, T. ;
Dutta, I. .
JOURNAL OF ELECTRONIC MATERIALS, 2008, 37 (03) :347-354