共 50 条
- [26] Resolution analysis using fully 3D electrical capacitive tomography Meas J Int Meas Confed, (270-279):
- [27] 3D analysis of semiconductor structures using HAADF STEM tomography ELECTRON MICROSCOPY AND ANALYSIS 2003, 2004, (179): : 31 - 34
- [28] Analysis of Crack Morphologies and Patterns from Thermal Fatigue using X-ray Tomography 20TH EUROPEAN CONFERENCE ON FRACTURE, 2014, 3 : 2180 - 2186
- [29] Correlating 3D porous structure in polymer films with mass transport properties using FIB-SEM tomography Chemical Engineering Science: X, 2021, 12
- [30] The 3D imaging and metrology of CMSX-4 superalloy microstructure using FIB-SEM tomography method STEREOLOGY AND IMAGE ANALYSIS IN MATERIAL SCIENCE, 2013, 197 : 89 - +