Deep-Ultraviolet AlGaN/AlN Core-Shell Multiple Quantum Wells on AlN Nanorods via Lithography-Free Method

被引:18
作者
Kim, Jinwan [1 ]
Choi, Uiho [1 ]
Pyeon, Jaedo [1 ]
So, Byeongchan [1 ]
Nam, Okhyun [1 ]
机构
[1] KPU, Dept Nanoopt Engn, Convergence Ctr Adv Nano Semicond CANS, Sangidaehakro 237, Siheung Si 429793, Gyeonggi Do, South Korea
来源
SCIENTIFIC REPORTS | 2018年 / 8卷
关键词
MOLECULAR-BEAM EPITAXY; LIGHT-EMITTING-DIODES; SURFACE; GAN; MORPHOLOGY; GROWTH; LIMITATIONS; HYDROGEN; POLARITY;
D O I
10.1038/s41598-017-19047-6
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
We report deep ultraviolet (UVC) emitting core-shell-type AlGaN/AlN multiple quantum wells (MQWs) on the AlN nanorods which are prepared by catalyst/lithography free process. The MQWs are grown on AlN nanorods on a sapphire substrate by polarity-selective epitaxy and etching (PSEE) using high-temperature metal organic chemical vapor deposition. The AlN nanorods prepared through PSEE have a low dislocation density because edge dislocations are bent toward neighboring N-polar AlN domains. The core-shell-type MQWs grown on AlN nanorods have three crystallographic orientations, and the final shape of the grown structure is explained by a ball-and-stick model. The photoluminescence (PL) intensity of MQWs grown on AlN nanorods is approximately 40 times higher than that of MQWs simultaneously grown on a planar structure. This result can be explained by increased internal quantum efficiency, large active volume, and increase in light extraction efficiency based on the examination in this study. Among those effects, the increase of active volume on AlN nanorods is considered to be the main reason for the enhancement of the PL intensity.
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页数:10
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