Molecular dynamics study of interfacial thermal transport between silicene and substrates

被引:53
作者
Zhang, Jingchao [1 ]
Hong, Yang [2 ]
Tong, Zhen [3 ]
Xiao, Zhihuai [4 ]
Bao, Hua [3 ]
Yue, Yanan [4 ]
机构
[1] Univ Nebraska, Holland Comp Ctr, Lincoln, NE 68588 USA
[2] Univ Nebraska, Dept Chem, Lincoln, NE 68588 USA
[3] Shanghai Jiao Tong Univ, Univ Michigan Shanghai Jiao Tong Univ Joint Inst, Shanghai 200240, Peoples R China
[4] Wuhan Univ, Sch Power & Mech Engn, Wuhan 430072, Hubei, Peoples R China
基金
中国国家自然科学基金;
关键词
BILAYER HETEROSTRUCTURE; GRAPHENE; CONDUCTIVITY; CONDUCTANCE; ENERGY; POTENTIALS; SIMULATION; CONTACT; ORDER; BOND;
D O I
10.1039/c5cp03323c
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
In this work, the interfacial thermal transport across silicene and various substrates, i.e., crystalline silicon (c-Si), amorphous silicon (a-Si), crystalline silica (c-SiO2) and amorphous silica (a-SiO2) are explored by classical molecular dynamics (MD) simulations. A transient pulsed heating technique is applied in this work to characterize the interfacial thermal resistance in all hybrid systems. It is reported that the interfacial thermal resistances between silicene and all substrates decrease nearly 40% with temperature from 100 K to 400 K, which is due to the enhanced phonon couplings from the anharmonicity effect. Analysis of phonon power spectra of all systems is performed to interpret simulation results. Contradictory to the traditional thought that amorphous structures tend to have poor thermal transport capabilities due to the disordered atomic configurations, it is calculated that amorphous silicon and silica substrates facilitate the interfacial thermal transport compared with their crystalline structures. Besides, the coupling effect from substrates can improve the interface thermal transport up to 43.5% for coupling strengths chi from 1.0 to 2.0. Our results provide fundamental knowledge and rational guidelines for the design and development of the next-generation silicene-based nanoelectronics and thermal interface materials.
引用
收藏
页码:23704 / 23710
页数:7
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