Measurement of crystal growth velocity in a melt-quenched phase-change material

被引:184
作者
Salinga, Martin [1 ]
Carria, Egidio [1 ]
Kaldenbach, Andreas [1 ]
Bornhoefft, Manuel [2 ]
Benke, Julia [1 ]
Mayer, Joachim [2 ]
Wuttig, Matthias [1 ]
机构
[1] Rhein Westfal TH Aachen, Phys Inst I & JARA FIT, D-52074 Aachen, Germany
[2] Rhein Westfal TH Aachen, Gemeinschaftslab Elektronenmikroskopie, D-52074 Aachen, Germany
关键词
THIN-FILMS; AMORPHOUS GE2SB2TE5; CALORIMETRIC MEASUREMENTS; STRUCTURAL RELAXATION; CRYSTALLIZATION; NUCLEATION; VISCOSITY; MICROSCOPY; RESISTANCE; KINETICS;
D O I
10.1038/ncomms3371
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Phase-change materials are the basis for next-generation memory devices and reconfigurable electronics, but fundamental understanding of the unconventional kinetics of their phase transitions has been hindered by challenges in the experimental quantification. Here we obtain deeper understanding based on the temperature dependence of the crystal growth velocity of the phase-change material AgInSbTe, as derived from laser-based time-resolved reflectivity measurements. We observe a strict Arrhenius behaviour for the growth velocity over eight orders of magnitude (from similar to 10 nm s(-1) to similar to 1 m s(-1)). This can be attributed to the formation of a glass at elevated temperatures because of rapid quenching of the melt. Further, the temperature dependence of the viscosity is derived, which reveals that the supercooled liquid phase must have an extremely high fragility (>100). Finally, the new experimental evidence leads to an interpretation, which comprehensively explains existing data from various different experiments reported in literature.
引用
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页数:8
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