Use of Artificial Intelligence Techniques to Fault Diagnosis in Analog Systems

被引：0

作者：

Rutkowski, Jerzy ^{[1
]}

Grzechca, Damian ^{[1
]}

机构：

[1] Silesian Tech Univ, Dept Automat Control Elect & Comp Sci, Akad St 16, PL-44100 Gliwice, Poland

来源：

PROCEEDINGS OF THE 2ND EUROPEAN COMPUTING CONFERENCE: NEW ASPECTS ON COMPUTERS RESEACH | 2008年

关键词：

Analog electronic fault diagnosis; parametric faults; artificial intelligence; NEURAL-NETWORK; GENETIC-ALGORITHM; CIRCUITS; SIGNAL; TIME; SELECTION;

D O I：

暂无

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

Basic concepts of fault diagnosis in analog and mixed (analog and digital) electronic systems by means of the simulation-before-test approach, the so called dictionary approach, have been presented. Special attention has been paid to application of artificial intelligence tools, such as: artificial neural networks, fuzzy sets and evolutionary computing.

引用

页码：267 / +

页数：4

共 58 条

[31] Parametric testing of mixed-signal circuits by ANN processing of transient responses [J].