Pipette SNOM AFM probe applicable to any wavelength and combination with confocal microscope

A novel pipette SNOM/AFM probe has been developed for its simple fabrication and applicability to wide wavelength range. The pipette probe is simply fabricated by a successive process of pulling, bending with a CO, laser, making a hole and coating with a metal layer. The hole is made on the tube at the back side of the tip for applying a light. The pipette probe is mounted on the SNOM/AFM system which includes a confocal microscope. The light is introduced to the hole directly by focusing from a confocal microscope or through an optical fiber. The probe provided clear topographic and optical images for a sample of a patterned chromium layer on a glass substrate and fluorescence beads. A confocal image was also obtained in a wide area of the same samples.