Precision increase with two orthogonal analyzers in polarization-resolved second-harmonic generation microscopy

被引：5
|
作者：
Refregier, Philippe [1 ]
Roche, Muriel [1 ]
Duboisset, Julien [1 ]
Brasselet, Sophie [1 ]
机构：
[1] Aix Marseille Univ, CNRS, UMR 7249, FRESNEL, F-13013 Marseille, France
来源：
OPTICS LETTERS | 2012年 / 37卷 / 20期
关键词：
ORIENTATION;
D O I：
10.1364/OL.37.004173
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We analyze the increase in precision of parameters estimation for polarization-resolved second-harmonic generation imaging microscopy when two intensities are measured with two orthogonal analyzers. The analysis is performed for measuring anisotropy parameters and molecule orientation for samples with cylindrical symmetry in the presence of photon noise with Poisson statistics. The improvement in comparison to global intensity measurement (i.e., without analyzer) is discussed. (C) 2012 Optical Society of America
引用
收藏
页码：4173 / 4175
页数：3
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